KINGSTON, R.I. -- October 6, 2003 -- Two of the worlds leading quality engineering researchers will speak at the University of Rhode Island on Thursday, Oct. 9 at 2 p.m. in the Cherry Auditorium of the Kirk Center of Advanced Technology.
Genichi Taguchi, executive director of the American Supplier Institute and president of Ohken Associates in Japan, and Rajesh Jugulum, a researcher in the Department of Mechanical Engineering of the Massachusetts Institute of Technology, will lecture on Design of Robust Systems. Their talk, sponsored by Texas Instruments, is free and open to the public.
Robust Design Methods (also known as Taguchi Methods) have been successfully applied in many engineering applications to improve the performance of products/processes so that they are minimally affected by various sources of variation, called noise factors. The methods are extremely cost effective. The lecturers will discuss the evolution of the methods through several case studies.
In addition to their use in designing engineering systems, these methods are also being used in the development of information systems for pattern recognition and analysis.
Taguchi, an international authority in quality engineering and robust design, was awarded the prestigious Deming Prize in 1960 and the Willard F. Rockwell Medal in 1986. He was inducted into the World Level of the Hall of Fame for Engineering, Science and Technology, USA, in 1998, and the Automotive Hall of Fame, USA, in 1997. In 2000, he was recognized as the Quality Champion of the 20th century. He authored or co-authored more than 500 technical articles in leading journals and about 50 books.
Jugulum completed his doctorate in 2000 at Wayne State University under the guidance of Taguchi. That year, he was awarded ASQs Richard A. Freund International Scholarship. He was featured as a "Face of Quality" in the September 2001 issue of Quality Progress. He is the recipient of the ASQs Feigenbaum medal. He has authored or co-authored several articles in leading technical journals and a book on pattern information technology.